Henry Hoff - GL Waytena, HA Hoff, RR Wolcott Jr, PR Broussard, CL VoId, and Clinton B. Lee, Effect of Substrate Smoothness on the Microstructure of YBa2Cu3O7~x/Y2O3/YBa2Cu3O7~x Trilayers, Journal of Electronic Materials, Vol

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      Publication Details (including relevant citation   information): GL Waytena, HA Hoff, RR Wolcott Jr, PR   Broussard, CL VoId, and Clinton B. Lee, Effect of Substrate   Smoothness on the Microstructure of YBa2Cu3O7~x/Y2O3/YBa2Cu3O7~x   Trilayers, Journal of Electronic Materials, Vol. 24, No. 3,   189-95 (1995), DOI: 10.1007/BF02659894.

      Abstract: null

      Address (URL): http://adsabs.harvard.edu/abs/1995JEMat..24..189W