Leonard Demoranville - SIMS–AMS depth profiles for NASA Genesis samples: Preliminary measurements.

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      Publication Details (including relevant citation   information):

      C. Cetina, K.S. Grabowski, D.L. Knies and L.T. Demoranville,   Applied Surface Science, 255, 2008, 1479   doi:10.1016/j.apsusc.2008.05.055

      Abstract:

      Address (URL): http://