Chad Snyder - C.R. Snyder and F.I. Mopsik, "A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion:  III. Conducting and Semiconducting Samples", IEEE Transactions on Instrumentation and Measurement, 50 (5), 1212 (2001)

Version 1

      Publication Details (including relevant citation   information): C.R. Snyder and F.I. Mopsik, "A Precision   Capacitance Cell for Measurement of Thin Film Out-of-Plane   Expansion: III. Conducting and Semiconducting Samples", IEEE   Transactions on Instrumentation and Measurement, 50 (5), 1212   (2001).

      Abstract: null

      Address (URL):