Chad Snyder - C.R. Snyder and F.I. Mopsik, "A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion: I. Thermal Expansion", Review of Scientific Instruments, 69 (11), 3889 (1998)

Version 1

      Publication Details (including relevant citation   information): C.R. Snyder and F.I. Mopsik, "A Precision   Capacitance Cell for Measurement of Thin Film Out-of-Plane   Expansion: I. Thermal Expansion", Review of Scientific   Instruments, 69 (11), 3889 (1998).

      Abstract: null

      Address (URL):