Joseph Imhof - Standard Sample Probes for Characterizing Optical Apertures in Near-field Scanning Optical Microscopy Joseph M. Imhof, Eun-Soo Kwak, and David A. Vanden Bout Rev

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  Publication Details (including relevant citation   information): Standard Sample Probes for Characterizing   Optical Apertures in Near-field Scanning Optical Microscopy   Joseph M. Imhof, Eun-Soo Kwak, and David A. Vanden Bout Rev. Sci.   Instrum., 74, 2424-2428 (2003)

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