Publication Details (including relevant citation information):
TJ Barnes, IM Kempson, CA Prestidge, Surface analysis for compositional, chemical and structural imaging in pharmaceutics with mass spectrometry: A ToF-SIMS perspective, International Journal of Pharmaceutics, 417,61-69, 2011.
We review the application of time-of-flight secondary-ion mass spectrometry (ToF-SIMS) for the surface chemical identification and distribution analysis (mapping) of pharmaceutically relevant materials. Specifically we explore the characterization of both solid state pharmaceuticals and bio-pharmaceuticals
by ToF-SIMS; highlighting specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices, the face-specific properties of pharmaceutical crystals and elucidation of the structure/conformation of adsorbed proteins. Finally, potential future applications of ToF-SIMS in
pharmaceutics are detailed.
Address (URL): http://