Ivan Kempson - Use of ToF-SIMS to study adsorption and loading behaviour of methylene blue and papain in a nano-porous silicon layer

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      Publication Details (including relevant citation   information):

      IM Kempson, T   Barnes, C Prestidge, Use of ToF-SIMS to study adsorption and   loading behaviour of methylene blue and papain in a nano-porous   silicon layer. Journal of the American Society of Mass   Spectrometry, 21(2)254-260, 2010.

      Abstract:

      TOF-SIMS was applied to study the cross-sectional distribution of   methylene blue and papain in porous silicon layers. Elemental and   molecular information were used to study their distributions in   the porous region and the chemistry of their adsorption.   Methylene blue (MW = 284 Da) penetrated to the base to the pores.   Positive ions (SiCH3+) suggest methylene blue binds to the   substrate via its methyl groups. Negative fragments (SiOSH3- and   SiO2SCH–) also suggested chemisorption via O bridging of the   substrate Si and methylene blue S. The larger Papain molecule   (23,406 Da) distributed itself in a similar manner to methylene   blue demonstrating larger molecules can be effectively   incorporated into such pore structures.

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