Ivan Kempson - Probing protein association with nano- and micro-scale structures with ToF-SIMS

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  Publication Details (including relevant citation   information):

  IM   Kempson, Y Hwu, C   Prestidge, Probing protein association with nano- and micro-scale   structures with ToF-SIMS, In Proteins at Interfaces III,   American Chemical Society, 2012


  Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can be   used for mass spectrometry and imaging of inorganic and organic   components on surfaces. Full spectral information for each pixel   down to sub-micron resolution provides a means to study protein   interactions with interfaces in highly heterogeneous structures,   assemblies and mixtures; patterned arrays; or simultaneous   correlation with other chemical features (gradients, spatial   arrangements etc). With careful spectral analysis and   interpretation, indications of protein orientation, bonds and   structural changes can be investigated. ToF-SIMS, with highly   sensitive mass fragmentation patterns and high spatial resolution   provides complementary information in systems with structurally   complex arrangements, chemical heterogeneity and multicomponent   mixtures. ToF-SIMS analysis of proteins at interfaces offers   unique complementary information which is described here in the   context of understanding protein interactions at interfaces with   examples of nano- and micro-scale structures. The use for   complementary characterization of surface chemical properties   which relate to
  protein interactions is also emphasized.

  Address (URL): http://pubs.acs.org/doi/pdf/10.1021/bk-2012-1120.ch033