Publication Details (including relevant citation information):
IM Kempson, Y Hwu, C Prestidge, Probing protein association with nano- and micro-scale structures with ToF-SIMS, In Proteins at Interfaces III, American Chemical Society, 2012
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can be used for mass spectrometry and imaging of inorganic and organic components on surfaces. Full spectral information for each pixel down to sub-micron resolution provides a means to study protein interactions with interfaces in highly heterogeneous structures, assemblies and mixtures; patterned arrays; or simultaneous correlation with other chemical features (gradients, spatial arrangements etc). With careful spectral analysis and interpretation, indications of protein orientation, bonds and structural changes can be investigated. ToF-SIMS, with highly sensitive mass fragmentation patterns and high spatial resolution provides complementary information in systems with structurally complex arrangements, chemical heterogeneity and multicomponent mixtures. ToF-SIMS analysis of proteins at interfaces offers unique complementary information which is described here in the context of understanding protein interactions at interfaces with examples of nano- and micro-scale structures. The use for complementary characterization of surface chemical properties which relate to
protein interactions is also emphasized.
Address (URL): http://pubs.acs.org/doi/pdf/10.1021/bk-2012-1120.ch033