K W Hipps - Characterization of Cu-CuTCNQ-M devices using scanning electron microscopy and scanning tunneling microscopy

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  Publication Details (including relevant citation   information):

  Hoagland, J. J., Wang, X. D., Hipps, K. W. Chemistry of   Materials 1993 5 (1) 54-60


  No abstract available.

  Address (URL): http://dx.doi.org/10.1021/cm00025a013