K W Hipps - Characterization of Cu-CuTCNQ-M devices using scanning electron microscopy and scanning tunneling microscopy

Version 1

      Publication Details (including relevant citation   information):

      Hoagland, J. J., Wang, X. D., Hipps, K. W. Chemistry of   Materials 1993 5 (1) 54-60

      Abstract:

      No abstract available.

      Address (URL): http://dx.doi.org/10.1021/cm00025a013